| File | Date | Descr | Size | Popular | Mfg | Model |
| FEM Modeling of Gigahertz TEM Cells for Susceptibility Analysis of RFID Products 5991-3773EN [4] : Full Text Matches - Check >> |
| FEM Modeling of Gigahertz TEM Cells for Susceptibility Analysis of RFID Products 5991-3773EN [4] : Forum Matches - Check >> |
| Found in: original (1) |
| FEM Modeling of Gigahertz TEM Cells for Susceptibility Analysis of RFID Products 5991-3773EN [4].pdf | 30/06/21 | Agilent FEM Modeling of Gigahertz TEM Cells for Susceptibility Analysis of RFID Products 5991-3773EN [4].pdf | 778 kB | 1 | Agilent | FEM Modeling of Gigahertz TEM Cells for Susceptibility Analysis of RFID Products 5991-3773EN [4] |
| Found in: fulltext index (99) |
| 5991-4080EN IBIS AMI Modeling of Retimer and Performance Analysis of Retimer based Active Serial Lin | 21/11/21 | Agilent 5991-4080EN IBIS AMI Modeling of Retimer and Performance Analysis of Retimer based Active Serial Links [22].pdf | 1779 kB | 1 | Agilent | 5991-4080EN IBIS AMI Modeling of Retimer and Performance Analysis of Retimer based Active Serial Lin |
| 5991-3789EN 3D FEM simulations of a scanning microwave microscope cantilever for imaging at the nano | 04/07/21 | Agilent 5991-3789EN 3D FEM simulations of a scanning microwave microscope cantilever for imaging at the nanoscale c20140711 [6].pdf | 1667 kB | 8 | Agilent | 5991-3789EN 3D FEM simulations of a scanning microwave microscope cantilever for imaging at the nano |
| 5991-2907EN Electromagnetic Simulations at the Nanoscale_ EMPro Modeling and Comparison to SMM Exper | 03/08/21 | Agilent 5991-2907EN Electromagnetic Simulations at the Nanoscale_ EMPro Modeling and Comparison to SMM Experiments c20141020 [8].pdf | 2514 kB | 9 | Agilent | 5991-2907EN Electromagnetic Simulations at the Nanoscale EMPro Modeling and Comparison to SMM Exper |
| Future Device Modeling Trends 5991-1629EN c20121129 [15].pdf | 27/08/20 | Agilent Future Device Modeling Trends 5991-1629EN c20121129 [15].pdf | 6076 kB | 6 | Agilent | Future Device Modeling Trends 5991-1629EN c20121129 [15] |
| 5991-0768EN Streaming_252C Analysis and Playback of RF Interference Signals in AD Applications - App | 03/07/21 | Agilent 5991-0768EN Streaming_252C Analysis and Playback of RF Interference Signals in AD Applications - Application Note c20140623 [9].pdf | 6991 kB | 1 | Agilent | 5991-0768EN Streaming 252C Analysis and Playback of RF Interference Signals in AD Applications - App |
| 5991-0992EN Three Reasons to Complement Your Scope Investment with PC-based Analysis Software - Appl | 12/10/21 | Agilent 5991-0992EN Three Reasons to Complement Your Scope Investment with PC-based Analysis Software - Application note c20140915 [7].pdf | 2413 kB | 3 | Agilent | 5991-0992EN Three Reasons to Complement Your Scope Investment with PC-based Analysis Software - Appl |
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| 5991-4317EN Understanding and Applying Probability of Intercept In Real-Time Spectrum Analysis- Appl | 05/12/21 | Agilent 5991-4317EN Understanding and Applying Probability of Intercept In Real-Time Spectrum Analysis- Application Note c20140815 [17].pdf | 2591 kB | 5 | Agilent | 5991-4317EN Understanding and Applying Probability of Intercept In Real-Time Spectrum Analysis- Appl |
| Sensitivity Analysis of One-port Characterized Devices in Vector Network Analyzer Calibrations 5991- | 13/11/21 | Agilent Sensitivity Analysis of One-port Characterized Devices in Vector Network Analyzer Calibrations 5991-1272EN c20140529 [13].pdf | 822 kB | 1 | Agilent | Sensitivity Analysis of One-port Characterized Devices in Vector Network Analyzer Calibrations 5991- |
| No Programming Required_ Multisignal Capture and Analysis DMMs - Application Note 5991-2283EN c20140 | 05/08/21 | Agilent No Programming Required_ Multisignal Capture and Analysis DMMs - Application Note 5991-2283EN c20140912 [5].pdf | 614 kB | 1 | Agilent | No Programming Required Multisignal Capture and Analysis DMMs - Application Note 5991-2283EN c20140 |
| 5991-4083EN Touchstone v2.0 SI PI S-Parameter Models for Simultaneous Switching Noise (SSN) Analysis | 07/07/21 | Agilent 5991-4083EN Touchstone v2.0 SI PI S-Parameter Models for Simultaneous Switching Noise (SSN) Analysis of DDR4 [18].pdf | 8069 kB | 1 | Agilent | 5991-4083EN Touchstone v2.0 SI PI S-Parameter Models for Simultaneous Switching Noise (SSN) Analysis |
| 5991-4584EN Low-Cost DDR3 Decode and Analysis with the 16850 Series Portable Logic Analyzers - Appli | 28/05/21 | Agilent 5991-4584EN Low-Cost DDR3 Decode and Analysis with the 16850 Series Portable Logic Analyzers - Application Note c20140724 [23].pdf | 2585 kB | 1 | Agilent | 5991-4584EN Low-Cost DDR3 Decode and Analysis with the 16850 Series Portable Logic Analyzers - Appli |
| 5991-2803EN Analysis of Test Coupon Structures for the Extraction of High Frequency PCB Material Pro | 05/10/21 | Agilent 5991-2803EN Analysis of Test Coupon Structures for the Extraction of High Frequency PCB Material Properties c20140721 [10].pdf | 2186 kB | 3 | Agilent | 5991-2803EN Analysis of Test Coupon Structures for the Extraction of High Frequency PCB Material Pro |
| 5991-4061EN DSOX6JITTER Jitter Analysis Option c20140925 [8].pdf | 22/01/20 | Agilent 5991-4061EN DSOX6JITTER Jitter Analysis Option c20140925 [8].pdf | 1237 kB | 2 | Agilent | 5991-4061EN DSOX6JITTER Jitter Analysis Option c20140925 [8] |
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| 5991-2662EN Logic Analysis Fundamentals - Application Note c20140929 [14].pdf | 20/12/19 | Agilent 5991-2662EN Logic Analysis Fundamentals - Application Note c20140929 [14].pdf | 1536 kB | 2 | Agilent | 5991-2662EN Logic Analysis Fundamentals - Application Note c20140929 [14] |
| 5991-4313EN M9064A VXA Vector Signal Analysis X-Series Measurement Application for PXIe Vector Signa | 27/09/21 | Agilent 5991-4313EN M9064A VXA Vector Signal Analysis X-Series Measurement Application for PXIe Vector Signal Analyzers c20140711 [10].pdf | 5945 kB | 2 | Agilent | 5991-4313EN M9064A VXA Vector Signal Analysis X-Series Measurement Application for PXIe Vector Signa |
| Lightwave Catalog_ Bit Error Ratio and Waveform Analysis 2014 Volume 3 - Catalog 5991-1802EN c201403 | 13/11/21 | Agilent Lightwave Catalog_ Bit Error Ratio and Waveform Analysis 2014 Volume 3 - Catalog 5991-1802EN c20140324 [40].pdf | 2557 kB | 1 | Agilent | Lightwave Catalog Bit Error Ratio and Waveform Analysis 2014 Volume 3 - Catalog 5991-1802EN c201403 |
| Frequency Domain Analysis of Jitter Amplification in Clock Channels 5991-1255EN [4].pdf | 28/08/20 | Agilent Frequency Domain Analysis of Jitter Amplification in Clock Channels 5991-1255EN [4].pdf | 265 kB | 1 | Agilent | Frequency Domain Analysis of Jitter Amplification in Clock Channels 5991-1255EN [4] |
| 5991-4703EN Spectrum Analysis and the Frequency Domain - Application Note c20140829 [14].pdf | 20/06/21 | Agilent 5991-4703EN Spectrum Analysis and the Frequency Domain - Application Note c20140829 [14].pdf | 281 kB | 1 | Agilent | 5991-4703EN Spectrum Analysis and the Frequency Domain - Application Note c20140829 [14] |
| 5991-4582EN 89601B BN-SSA 89600 VSA Software - Spectrum Analysis Option - Technical Overview c201410 | 06/08/21 | Agilent 5991-4582EN 89601B BN-SSA 89600 VSA Software - Spectrum Analysis Option - Technical Overview c20141016 [14].pdf | 827 kB | 4 | Agilent | 5991-4582EN 89601B BN-SSA 89600 VSA Software - Spectrum Analysis Option - Technical Overview c201410 |