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Now downloading free:Agilent 5991-2907EN Electromagnetic Simulations at the Nanoscale EMPro Modeling and Comparison to SMM Exper

Agilent 5991-2907EN Electromagnetic Simulations at the Nanoscale EMPro Modeling and Comparison to SMM Exper free download

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File name:5991-2907EN Electromagnetic Simulations at the Nanoscale_ EMPro Modeling and Comparison to SMM Exper
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File name 5991-2907EN Electromagnetic Simulations at the Nanoscale_ EMPro Modeling and Comparison to SMM Exper

Keysight Technologies Electromagnetic Simulations at the Nanoscale: EMPro Modeling and Comparison to SMM Experiments Application Note Introduction n this application note, we describe electromagnetic (EM) simulations using Keysight Technologies' EMPro software1 to support the interpretation of scanning microwave microscope (SMM) experiments. The SMM is a new scanning probe microscope that combines the electromagnetic measurement capabilities of a microwave Performance Network Analyzer (PNA) with the nanometer-resolution and Angstrom-scale positioning capabilities of an atomic force microscope (AFM). Scanning microwave microscopy is a technique for measuring reflection scattering parameters and corresponding electric properties of materials at the nanoscale in the frequency range of 1



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