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|5187_pulse_laser.pdf||Pulse Testing Of Laser Diodes
By: Paul Meyer
Keithley Instruments, Inc.
Thermal management is critical during the testing of laser diodes at the
semiconductor wafer, bar, and chip-on-carrier (submount) production stages.
This has led to pulse testing of laser diodes to minimize power dissipation. Still,
pulse mode testing requires careful selection and configuration of test equipment
to avoid measurement errors and achieve the most cost-effective results.
Basic Light intensity-Current-Voltage (L-I-V) testing is an I-V test with the addition
of optical power measurements. This test is primarily used to sort laser diodes or
weed out bad devices before they become part of an assembly. The device
under test (DUT) is subjected to a current sweep while the forward voltage drop
is recorded for each step in the sweep. Simultaneously, instrumentation is used
to monitor the optical power output of the laser's front |
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