| File | File in archive | Date | Context | Size | DLs | Mfg | Model |
| 5991-3188EN 7500 AFM Applications in Polymer Materials - Application Note c20141020 [2].pdf | 5991-3188EN 7500 AFM Applications in Polymer Materials - Application Note c20141020 [2].pdf | 12/10/21 | Keysight Technologies
7500 AFM Applicati | 186 kB | 1 | Agilent | 5991-3188EN 7500 AFM Applications in Polymer Materials - Application Note c20141020 [2] |
| 7500 Atomic Force Microscope (AFM) - Data Sheet 5991-3639EN c20140827 [8].pdf | 7500 Atomic Force Microscope (AFM) - Data Sheet 5991-3639EN c20140827 [8].pdf | 01/02/20 | Keysight 7500 AFM
| 858 kB | 11 | Agilent | 7500 Atomic Force Microscope (AFM) - Data Sheet 5991-3639EN c20140827 [8] |
| 5991-3186EN Humidity-dependent Surface Chemistry Studied by 7500 Atomic Force Microscopy - Applicati | 5991-3186EN Humidity-dependent Surface Chemistry Studied by 7500 Atomic Force Microscopy - Applicati | 29/09/21 | Keysight Technologies
Humidity-dependent | 117 kB | 2 | Agilent | 5991-3186EN Humidity-dependent Surface Chemistry Studied by 7500 Atomic Force Microscopy - Applicati |
| 5991-3251EN Vapor Annealing Effect on Copolymers Studied by 7500 AFM with Environmental Control-Appl | 5991-3251EN Vapor Annealing Effect on Copolymers Studied by 7500 AFM with Environmental Control-Appl | 26/10/21 | Keysight Technologies
Vapor Annealing Ef | 116 kB | 3 | Agilent | 5991-3251EN Vapor Annealing Effect on Copolymers Studied by 7500 AFM with Environmental Control-Appl |
| 5991-3185EN Magnetic Force Microscopy Studies Using the Keysight 7500 AFM - Application Note c201410 | 5991-3185EN Magnetic Force Microscopy Studies Using the Keysight 7500 AFM - Application Note c201410 | 12/10/21 | Keysight Technologies
Magnetic Force Mic | 287 kB | 1 | Agilent | 5991-3185EN Magnetic Force Microscopy Studies Using the Keysight 7500 AFM - Application Note c201410 |
| 5991-3184EN Current Sensing AFM Measurements Using 7500 AFM - Application Note c20141020 [2].pdf | 5991-3184EN Current Sensing AFM Measurements Using 7500 AFM - Application Note c20141020 [2].pdf | 03/11/21 | Keysight Technologies
Current Sensin | 98 kB | 1 | Agilent | 5991-3184EN Current Sensing AFM Measurements Using 7500 AFM - Application Note c20141020 [2] |
| 5991-3517EN High Resolution Imaging with 7500 AFM - Application Note c20141020 [4].pdf | 5991-3517EN High Resolution Imaging with 7500 AFM - Application Note c20141020 [4].pdf | 26/08/20 | Keysight Technologies
High Resolution Im | 266 kB | 1 | Agilent | 5991-3517EN High Resolution Imaging with 7500 AFM - Application Note c20141020 [4] |
| 5989-6405EN English _ 2013-08-30 _ PDF 1.31 MB c20141106 [8].pdf | 5989-6405EN English _ 2013-08-30 _ PDF 1.31 MB c20141106 [8].pdf | 27/11/19 | Keysight Technologies
5500 AFM
| 1889 kB | 2 | Agilent | 5989-6405EN English 2013-08-30 PDF 1.31 MB c20141106 [8] |
| 5991-3468EN Humidity-dependent AFM Nanolithography - Application Note c20141020 [2].pdf | 5991-3468EN Humidity-dependent AFM Nanolithography - Application Note c20141020 [2].pdf | 27/08/20 | Keysight Technologies
Humidity-dependent | 107 kB | 1 | Agilent | 5991-3468EN Humidity-dependent AFM Nanolithography - Application Note c20141020 [2] |
| 5991-4598EN 7500 ILM Atomic Force Microscope (AFM) - Data Sheet c20141107 [2].pdf | 5991-4598EN 7500 ILM Atomic Force Microscope (AFM) - Data Sheet c20141107 [2].pdf | 28/08/20 | | 290 kB | 1 | Agilent | 5991-4598EN 7500 ILM Atomic Force Microscope (AFM) - Data Sheet c20141107 [2] |
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| 5991-3518EN Differentiating Surface Mechanical Properties with Dynamic Lateral Force Microscopy-Appl | 5991-3518EN Differentiating Surface Mechanical Properties with Dynamic Lateral Force Microscopy-Appl | 15/06/21 | Keysight Technologies
Differentiating Su | 467 kB | 3 | Agilent | 5991-3518EN Differentiating Surface Mechanical Properties with Dynamic Lateral Force Microscopy-Appl |
| 5991-3183EN Surface Potential Measurements Using the Keysight 7500 AFM - Application Note c20141020 | 5991-3183EN Surface Potential Measurements Using the Keysight 7500 AFM - Application Note c20141020 | 14/06/21 | Keysight 5600LS AFM
Surface Potential Me | 964 kB | 1 | Agilent | 5991-3183EN Surface Potential Measurements Using the Keysight 7500 AFM - Application Note c20141020 |
| 5991-3295EN Elastic Modulus Mapping Using the 7500 AFM - Application Note c20141020 [4].pdf | 5991-3295EN Elastic Modulus Mapping Using the 7500 AFM - Application Note c20141020 [4].pdf | 25/08/21 | Keysight Technologies
Elastic Modulus Ma | 138 kB | 1 | Agilent | 5991-3295EN Elastic Modulus Mapping Using the 7500 AFM - Application Note c20141020 [4] |
| TVR-3705FR & 3730FR & 5130FR & 5530FR Ver 2.PDF | TVR-3705FR & 3730FR & 5130FR & 5530FR Ver 2.PDF | 18/08/22 | Service Manual
Grundig Servic | 87 kB | 2 | Grundig | TVR-3705FR & 3730FR & 5130FR & 5530FR Ver 2 |
| TVR-3705.PDF | TVR-3705.PDF | 16/01/22 | Service Manual
Grundig Servic | 200 kB | 2 | Grundig | TVR-3705 |
| TVR-3705FR & 3730FR & 5130FR & 5530FR.PDF | TVR-3705FR & 3730FR & 5130FR & 5530FR.PDF | 14/06/22 | Service Manual
| 80 kB | 1 | Grundig | TVR-3705FR & 3730FR & 5130FR & 5530FR |
| TVR-3705FR Ver 2.PDF | TVR-3705FR Ver 2.PDF | 01/03/22 | Service Manual
| 80 kB | 1 | Grundig | TVR-3705FR Ver 2 |
| 5991-2907EN Electromagnetic Simulations at the Nanoscale_ EMPro Modeling and Comparison to SMM Exper | 5991-2907EN Electromagnetic Simulations at the Nanoscale_ EMPro Modeling and Comparison to SMM Exper | 03/08/21 | Keysight Technologies
Electromagnetic Si | 2514 kB | 9 | Agilent | 5991-2907EN Electromagnetic Simulations at the Nanoscale EMPro Modeling and Comparison to SMM Exper |
| 5991-2917EN AFM SPM Accessories - Brochure c20141029 [20].pdf | 5991-2917EN AFM SPM Accessories - Brochure c20141029 [20].pdf | 26/08/20 | Keysight Technologies
AFM/SPM Accessorie | 658 kB | 4 | Agilent | 5991-2917EN AFM SPM Accessories - Brochure c20141029 [20] |
| Charging Mitigation Strategies in Imaging Insulating Polymer Spheres via Low Voltage Field Emission | Charging Mitigation Strategies in Imaging Insulating Polymer Spheres via Low Voltage Field Emission | 06/06/21 | Charging Mitigation Strategies in Imagin | 987 kB | 1 | Agilent | Charging Mitigation Strategies in Imaging Insulating Polymer Spheres via Low Voltage Field Emission |